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CTEM

AEME

The conventional transmission electron microscope (CTEM) is a JEOL  200CX instrument with a side-entry double-tilt goniometer  stage and an assortment of specimen holders. This microscope can be operated between 80 and 200 kV in the TEM or STEM  mode. Diffraction modes include  convergent beam diffraction for three-dimensional  structure information and micro-diffraction with a  minimum probe size of 20nm.

For updates or details, contact Zonghoon Lee or Velimir Radmilovic.

 

Microscopists planning to use a heating specimen holder should consult the heating holder guidelines and should bring a supply of VHS video tapes if dynamic recording of the experiment is planned.


Specimen Holders

Gatan 636 double-tilt analytical

170/+150°C

±60/±30°

JEOL BST double-tilt

-

± 60/±45°

JEOL SCSH single-tilt, (bulk, graphite inserts)

-

±60°

JEOL SQH10 single-tilt, double-specimen

-

± 60°

JEOL BSR single-tilt / rotation holder

-

± 60°

Gatan 628Ta single-tilt heating

<1300°C

± 60°

Gatan 652Ta double-tilt heating

<1000°C

± 60/±30°

Single-tilt

-

±60°

Double-tilt

-

±60/±45°

Single-tilt heating

<1300°C

±60°

Double-tilt heating

<1000°C

±60/±30°

Double tilt cooling/heating

-170/+150°C

±60/±30°

Double-tilt electrical biasing
Two electrical contacts to top surface of specimen.; maximum voltage 100V; maximum current 1Å.

-

±40/±15°

Single tilt electrical biasing heating:
Two electrical contacts to top surface of specimen.; maximum voltage 100V; maximum current 1A.

950°C

±40°

Electrochemical biasing
Enclosed electrolyte reservoir, 3mmx2mmx1mm. Two electrical contacts, one to the top surface of the sample, the other to the reservoir; maximum voltage 150V; maximum current 1A.

-

±35°

Dark field image using forbidden 1/3{224} reflection of microfaceted S3 {112} grain boundary in Au. Due to the strong anisotropy of the S3 interface energy grain boundary inclination adopts only orientation of low-energy boundaries.

Corresponding <111> diffraction pattern of the Au {111} mazed bicrystal.
A ZA BF image and SADP showing the non-crystallographic fracture path of an indentation-induced penny crack in a Silicon wedge sample. Thickness fringes can be seen parallel to the surface and remnant dislocations can be seen along the top of the fracture path. (A. Minor, NCEM)

 

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