Masashi Watanabe

Thank you very much for invitation!

• Oak Ridge National Laboratory, "High Spatial Resolution Chemical Analysis of Materials Using Aberration-Corrected Scanning Transmission Electron Microscopes", Nov./14/'06, Oak Ridge, TN.
• Lawrence Berkeley National Laboratory, "Recent Progress on X-ray Analysis for Materials Characterization in Aberration-Corrected Scanning Transmission Electron Microscopes", Sep./28/'06, Berkeley, CA.
• 16th International Microscopy Congress, "Progress on X-ray Analysis of Materials in Aberration-Corrected Scanning Transmission Electron Microscopes", Sep./5/'06, Sapporo, Japan.
• Annual meeting of Microscopy & Microanalysis 2006, "Progress of Elemental/Compositional Mapping via X-rays and Energy-Loss Electrons in Analytical Electron Microscopes", Aug./2/'06, Chicago, IL.
• SuperSTEM Summer School 2006, "Advantage of X-ray analysis in aberration-corrected analytical electron microscopes ", June/25/'06, Daresbury, UK
• Graz University of Technology, "Atomic-Level Characterization of Materials by X-Ray Analysis in Analytical Electron Microscopes", June/20/'06, Graz, Austria
• Max-Planck-Institute für Metallforschung, "Atomic level characterization in Conventional and Spherical Aberration-Corrected Analytical electron microscopes", Oct./24/'05, Stuttgart, Germany
• Graduiertenkolleg "Innere Grenzflächen, "Materials Characterization via X-ray Analysis in Analytical Electron Microscope", Oct./12/'05, Irsee, Germany
• 10th Frontiers of Electron Microscopy in Materials Science, "Frontiers of X-ray Analysis in Analytical Electron Microscopy: Toward Atomic-Scale Resolution and Single-Atom Sensitivity", Sep./27/'05, Kasteel Vaalsbroek, Netherlands
• Annual meeting of Microscopy & Microanalysis 2005, "Advantages of Cs-correctors for Spectrometry in STEM", Aug./2/'05, Honolulu, HI
• Naval Research Laboratory, "Application of Focused Ion Beam for Specimen Preparation for TEM", July/15/'05, Washington, DC
• Solid-Solid Phase Transformations in Inorganic Materials 2005, "Atomic-Level Analytical Electron Microscopy of Diffusional Phase Transformations", May/31/'05, Phoenix, AZ
• Scanning 2005, "Current State of X-ray Mapping/Spectrum-Imaging in Conventional and Cs-Corrected Analytical STEMs: Toward Atomic Scale Resolution", Apr./7/'05, Monterey CA
• Center for Advanced Materials and Nanotechnology Forum, "Advantages of Cs-correctors for STEM Spectrometry", Mar./2/'05, Bethlehem, PA
• AMAS VIII - The Eight Biennial Symposium, "Improvements in Quantitative STEM-XEDS Mapping by Principal Component Analysis and z-Factor Methods", Feb./16/'05, Melbourne, Australia
• Max-Planck-Institute für Metallforschung, "Multivariate Statistical Analysis of Spectrum Profiling and Imaging", Nov./22/'04, Stuttgart, Germany
• Max-Planck-Institute für Metallforschung, "An Introduction of Quantitative X-ray Micro(Nano)analysis in Analytical Electron Microscopes", Nov./15/'04, Stuttgart, Germany
• 20th AEM Workshop, "Current Progress in Analytical Electron Microscopy", Aug./31/'04, Chiba, Japan (in Japanese)
• Annual meeting of Microscopy & Microanalysis 2004, "High Resolution X-Ray Elemental Mapping of Nanoparticles in the STEM", Aug./3/'04, Savannah, GA
• Materials Research Society 2004 spring meeting, "Characterization of Elemental Segregation in Alloys by Quantitative STEM X-ray Mapping and TEM Orientation Imaging", Apr./14/'04, Sun Francisco, CA
• Sandia National Laboratory, "Quantitative Microanalysis of Boundary Segregation and Fine Precipitates in Materials by Analytical STEM"", Oct./12/'03, Livemore, CA
• 9th Frontiers of Electron Microscopy in Materials Science, "Quantitative X-Ray Nanoanalysis and Mapping in the AEM", Oct./6/'03, Berkley, CA
• Annual meeting of Microscopy & Microanalysis 2003, "Accurate Determination of Grain Boundary Coverages of Segregating Elements by STEM X-ray Mapping Combined with the z-factor Method", Aug./5/'03, San Antonio, TX
• Microbeam Analysis Society Workshop on Spectrum-Imaging and Hyperspectral Data Analysis 2003, "Application of Principal Component Analysis in STEM-XEDS Spectrum-Imaging", Apr./30/'03, NIST, Gaithersburg, MD
• Annual meeting of the Japanese Society of Electron Microscopy, "Future Direction of Quantitative X-ray Mapping in Analytical Electron Microscopy", Nov./11/'02, Sendai, Japan (in Japanese)
• Annual meeting of the Japanese Society of Surface Analysis, "Evaluation of Spatial Resolution for Microanalysis in the Analytical Electron Microscope", Oct./15/'00, Shiga, Japan (in Japanese)
• 16th AEM Workshop, "Application of quantitative X-ray Mapping for Measurements of Boundary Segregation", Sep./1/'00, Tokyo, Japan (in Japanese)
• Annual meeting of the Japanese Society of Electron Microscopy, "Quantitative X-ray Microanalysis in Analytical Electron Microscopy", May/20/'00, Tokyo, Japan (in Japanese)
• 15th AEM Workshop, "Comparison of Elemental Mapping Techniques: XEDS mapping vs. EELS mapping", Sep./4/'99, Tokyo, Japan 1999 (in Japanese)
• 14th AEM Workshop, "Quantitative X-ray Mapping in Analytical Electron Microscopes", Sep./1/'98, Tokyo, Japan (in Japanese)
• 14th International Congress on Electron Microscopy, "The z-Factor Approach for Quantitative Composition and Thickness Mapping in AEM-XEDS", Sep./2/'98, Cancun, Mexico