| A strain-driven morphotropic phase boundary in BiFeO3 R. J. Zeches, M. D. Rossell, J. X. Zhang, A. J. Hatt, Q. He, C.-H. Yang, A. Kumar, C. H. Wang, A. Melville, C. Adamo, G. Sheng, Y.-H. Chu, J. F. Ihlefeld, R. Erni, C. Ederer, V. Gopalan, L. Q. Chen, D. G. Schlom, N. A. Spaldin, L. W. Martin, R. Ramesh Science 326 (2009) 977 DOI: 10.1126/science.1177046 Link to pdf file |
| Electron beam mapping of plasmon resonances in electromagnetically interacting gold nanorods M. N’Gom, S. Li, G. Schatz, R. Erni, A. Agarwal, N. Kotov, T. B. Norris Physical Review B 80 (2009) 113411 DOI: 10.1103/PhysRevB.80.113411 Link to pdf file |
| Optimization of exit-plane waves restored from HRTEM through-focal series R. Erni, M. D. Rossell, P. N. H. Nakashima, Ultramicroscopy/j.ultramic.2009.10.015, DOI:10.1016 Link to pdf file |
DNA-templated synthesis of Pt nanoparticles on single-walled carbon |
Aberration-corrected Electron Microscopy Imaging for Nanoelectronics Applications |
Atomically thin hexagonal boron nitride probed by ultrahigh-resolution |
Background, Status and Future of the Transmission Electron Aberration-corrected Microscope Project |
Atomic-resolution three-dimensional imaging of germanium self-interstitials near a surface: Aberration-corrected transmission electron microscopy |
Atomic-resolution imaging of lithium in Al3Li precipitates |
First application of Cc-corrected imaging for high-resolution and energy-filtered TEM |
Graphene at the Edge: Stability and Dynamics |
Atomic-Resolution Imaging with a Sub-50-pm Electron Probe |
First performance measurements and application results of a new high brightness Schottky field emitter for HR-S/TEM at 80-300kV acceleration voltage |
Using a monochromator to improve the resolution in focal-series reconstructed TEM down to 0.5Å |
Determining resolution in the transmission electron microscope: object-defined resolution below 0.5Å B. Freitag and C. Kisielowski M. Luysberg, K. Tillmann, T. Weirich (Eds.): EMC , Vol. 1: Instrumentation and Methods, pp. 21–22, (2008) DOI: 10.1007/978-3-540-85156-1_11, © Springer-Verlag Berlin Heidelberg Link to pdf file |
| Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEM M. Haider , H. Muller, S. Uhlemann, J. Zach, U. Loebau, R. Hoeschen Ultramicroscopy 108 167–178 (2008) DOI:10.1016/j.ultramic.2007.07.007 Link to pdf file |
An update on the TEAM project - first results from the TEAM 0.5 microscope, and its future development U. Dahmen, R. Erni, C. Kisielowki, V. Radmilovic, Q. Ramasse, A. Schmid, T. Duden, M. Watanabe, A. Minor, and P. Denes M. Luysberg, K. Tillmann, T. Weirich (Eds.): EMC, Vol. 1: Instrumentation and Methods, pp. 3–4, (2008) DOI: 10.1007/978-3-540-85156-1_2, © Springer-Verlag Berlin Heidelberg 2008 Link to pdf file |
Structure determination of H-encapsulating clathrate compounds in aberration-corrected STEM Q.M. Ramasse, N.L. Okamoto, D. Morgan, D. Neiner, C.L. Condron, J. Wang, P. Yu, N.D. Browning, and S. Kauzlarich M. Luysberg, K. Tillmann, T. Weirich (Eds.): EMC , Vol. 1: Instrumentation and Methods, pp. 45–46, (2008) DOI: 10.1007/978-3-540-85156-1_23, © Springer-Verlag Berlin Heidelberg Link to pdf file |
Electron Beam Induced Damage: An Atom-by-atom Investigation with TEAM0.5, C. Kisielowski, R. Erni, J. Meyer, Imaging & Microscopy 10 24-25 (2008) DOI: 10.1002/imic.200890062 |
First performance measurements and application results of a new high brightness Schottky field emitter for HR-S/TEM at 80-300kV acceleration voltage, B. Freitag, G Knippels, S. Kujawa, P.C. Tiemeijer, M. Van der Stam, D. Hubert, C. Kisielowski, P. Denes, A. Minor and U. Dahmen, Microscopy and Microanalysis 14 Suppl. 2 1370-1371 (2008) DOI: 10.1017/S1431927608087370 Link to pdf file |
Atomic Structure of Core-Shell Precipitates in Al-Li-Sc-Zr Alloys Studied by Analytical and Aberration-Corrected TEM/STEM, M.D. Rossell, R. Erni, A. Tolley, E. Marquis, V. Radmilovic, and U. Dahmen, Microscopy and Microanalysis 14 Suppl. 2 1348-1349 (2008) DOI: 10.1017/S1431927608084808 Link to pdf file |
Object-defined Resolution Below 0.5Å in Transmission Electron Microscopy – Recent Advances on the TEAM 0.5 Instrument, C. Kisielowski, R. Erni, B. Freitag, Microscopy and Microanalysis 14 Suppl. 2 78-79 (2008) DOI: 10.1017/S143192760808759X Link to pdf file |
Microscopy of Clathrate Compounds: Determining the Structure and Hydrogen Encapsulating Properties through Aberration-Corrected HAADF-STEM, Q.M. Ramasse, N.L. Okamoto, D. Morgan, D. Neiner, C.L.Condron, J. Wang, P.Yu, N.D. Browning, and S. Kauzlarich, Microscopy and Microanalysis 14 Suppl. 2 270-271 (2008) DOI: 10.1017/S1431927608087837 Link to pdf file |
Direct imaging of lattice atoms and topological defects in graphene membranes, J. C. Meyer, C. Kisielowski, R. Erni, M. D. Rossell, M. F. Crommie, A. Zettl, Nano Letters, , 8 (11), pp 3582–3586, (2008) DOI: 10.1021/nl801386m. http://pubs.acs.org/cgi-bin/abstract.cgi/nalefd/asap/abs/nl801386m.html |
| Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-corrected Electron Microscopy with 0.5 Å Information Limit, C. Kisielowski, B. Freitag, M. Bischoff, H. van Lin, S. Lazar, G. Knippels, P. Tiemeijer, M. van der Stam, S. von Harrach, M. Stekelenburg, M. Haider, H. Muller, P. Hartel, B. Kabius, D. Miller, I. Petrov, E. Olson, T. Donchev, E. A. Kenik, A. Lupini, J. Bentley, S. Pennycook, A. M. Minor, A. K. Schmid, T. Duden, V. Radmilovic, Q. Ramasse, R. Erni, M. Watanabe, E. Stach, P. Denes, U. Dahmen, Microscopy and Microanalysis 14454-462 (2008) DOI:10.1017/S1431927608080902 Link to pdf file |
| A Status Report on the TEAM Project U. Dahmen, Microsc Microanal 13(Suppl 2), (2007) DOI: 10.1017/S1431927607079603 Link to pdf file |